Mishra, DeepakBaral, ArijitHaque, NasirulChakravorti, Sivaji2023-07-212025-02-012023-07-212018-10-07D. Mishra, A. Baral, N. Haque and S. Chakravorti, "Feasibility of using Normalized De-trapped Charge for Diagnosis of Power Transformer Insulation," 2018 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC), Kota Kinabalu, Malaysia, 2018, pp. 555-558, doi: 10.1109/APPEEC.2018.8566434.978-1-5386-5686-0978-1-5386-5685-3https://ieeexplore.ieee.org/document/8566434https://dspacenew8-imu.refread.com/handle/123456789/1860In order to use de-trapped interfacial charge as a performance parameter for diagnosis, it is necessary to reduce the influence of insulation geometry. Available literature shows that this can be done by considering dc insulation resistance R 0 as the normalization factor. Such normalization may not be always practically feasible as information regarding R 0 requires measurement of temperature sensitive low amplitude current. In this paper it is shown that geometric capacitance C 0 (instead of R 0 ) can be used as an effective normalization parameter to reduce effect of insulation geometry. Effect of normalizing freed interfacial charge using C 0 and R 0 and its subsequent effect on insulation diagnosis are presented in this paper.en-USSpace chargeDielectric measurementPower transformerDielectric materialsConference Proceeding